17 results
F-62 XRF by Simultaneous Use of K- and L-Lines of an Element
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- Powder Diffraction / Volume 23 / Issue 2 / June 2008
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- 20 May 2016, p. 180
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F49 Simultaneous analysis of nickel alloys and high alloy steels using the fundamental parameter method
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- Powder Diffraction / Volume 21 / Issue 2 / June 2006
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- 20 May 2016, p. 173
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F-35 Comparison of Computed Absolute Fluorescence Photon Counts with Data from Fully Calibrated Beamlines and Detectors at PTB/BESSY-II
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- Powder Diffraction / Volume 19 / Issue 2 / June 2004
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- 20 May 2016, p. 200
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C11 Standardless XRF—Invited
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- Powder Diffraction / Volume 20 / Issue 2 / June 2005
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- 20 May 2016, p. 183
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D-39 Monte-Carlo Simulations for Evaluation of Different Influences on Projections in Computed Tomography
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- Powder Diffraction / Volume 24 / Issue 2 / June 2009
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- 20 May 2016, p. 167
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F13 Fundamental Parameter Method Using Scattering X-rays in X-ray Fluorescence Analysis
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- Powder Diffraction / Volume 20 / Issue 2 / June 2005
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- 20 May 2016, p. 183
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Monte Carlo simulation of projections in computed tomography
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- Powder Diffraction / Volume 23 / Issue 2 / June 2008
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- 29 February 2012, pp. 150-153
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Monte Carlo simulations for the evaluation of various influence factors on projections in computed tomography
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- Powder Diffraction / Volume 25 / Issue 2 / June 2010
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- 29 February 2012, pp. 165-168
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Electron Tomography of Meiotic Spindle Components in Caenorhabditis elegans
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 140-141
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- August 2005
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Analysis of Thin Films and Multi-Layer Thin Films containing Light Elements by XRF
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- Advances in X-ray Analysis / Volume 39 / 1995
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- 06 March 2019, pp. 701-706
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- 1995
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Analysis of Multi-Layer Thin Films by XRF
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- Advances in X-ray Analysis / Volume 37 / 1993
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- 06 March 2019, pp. 205-212
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- 1993
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XRFA of Carbon in Steels
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- Advances in X-ray Analysis / Volume 36 / 1992
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- 06 March 2019, pp. 41-46
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- 1992
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Analysis of Graphite in Caststeels using XRFA
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- Advances in X-ray Analysis / Volume 36 / 1992
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- 06 March 2019, pp. 35-40
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- 1992
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The Temperature Profiles along Heating-Strips in High Temperature Chambers for XRD
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- Advances in X-ray Analysis / Volume 36 / 1992
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- 06 March 2019, pp. 403-410
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- 1992
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An X-Ray Spectrometer for Pixel Analysis of Art Objects
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- Advances in X-ray Analysis / Volume 35 / Issue B / 1991
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- 06 March 2019, pp. 987-993
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- 1991
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Imaging XPS. A Contribution to 3D X-ray Analysis
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- Advances in X-ray Analysis / Volume 34 / 1990
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- 06 March 2019, pp. 201-211
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- 1990
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The Concept of Pathlength Distributions Applied to Fundamental Parameter Approach
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- Advances in X-ray Analysis / Volume 33 / 1989
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- 06 March 2019, pp. 499-508
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- 1989
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